The Agilent E5503B phase noise measurement solution simplifies ATE test times for one-port VOC's, DROs, crystal oscillators and synthesizers and maximizes capability for R& D benchtop applications. In addition, with a standard offset range capability from 0.01 Hz to 100 MHz, the Agilent E5503B provides the capability, flexibility and versatility to meet changing and demanding needs placed upon the R&D engineer. By building upon 30 years of Agilent Technologies low phase noise, RF design and measurement experience, the Agilent E5503B solution continues to provide excellent measurement integrity, repeatability and accuracy. The Agilent E5503B phase noise measurement solution has been designed to simplify phase noise measurements of one-port VCOs, DROs, crystal oscillators, and synthesizers and to maximize the capability for R&D benchtop applications. The Agilent E5503B solution continues to provide excellent measurement integrity, repeatability and accuracy.

Other features and specifications include:

●50 kHz to 18 GHz

●Ability to test a wide range of devices

●Measure AM noise directly

●Measure offsets to 100 MHz

●Industry leading sensitivity

●Stepped upgrade path from Agilent 3048 Systems

●E4411A 1.5 GHz RFSA

●70420A MMS Baseband Phase Noise Test Set

●70001A MMS Mainframe

●E5481A LTU ACM Software

●E5483A LTU ACM Software