It can measure ultra-low leakage current in components, dark current in optical devices and beam current in microscopic instruments.
High-precision current measurement is possible, even in circuits with very low source voltage.
Simplifies the process of analyzing multi-channel devices, monitoring currents at multiple locations on the material, and recording data from multiple sensors at once.
Make sure you can find a voltage bias function that suits your application requirements. Insulation resistance test with a 500V source in a 6487 picoammeter / voltage source.
Allows the transmission of measurement results to devices such as digital multimeters, data acquisition cards, oscilloscopes, or strip chart recorders for signal response and trend analysis.
Support measuring high current, such as measuring 4-20mA sensor circuit.
Support high throughput production test requirements.
It simplifies the process of synchronizing with other instruments and voltage sources by combining six independently selectable trigger lines on a single connector to control all instruments in the system simply and directly.