The semiconductor parameter analyzer (device analyzer) is a test instrument that integrates multiple measurement and analysis capabilities to perform the current‐voltage (IV) and capacitance measurement (CV (capacitance‐ voltage), C‐f (capacitance frequency), and C‐t (capacitance-time)) measurements accurately and those analyses quickly and easily in a box for the semiconductor parametric test. The semiconductor parametric test is a fundamental measurement to determine the characteristics of a semiconductor device and its manufacturing process. In the parametric test, typically the IV measurement including low‐current measurement down to fA (femto amp) resolution and CV measurements up to 1 MHz are performed, and key characteristics/parameters are analyzed. Although the semiconductor parameter analyzer is originally designed to perform those semiconductor evaluations, it is currently used for IV and CV characterizations of various materials, devices and electronics widely because of its superior performance, powerful capabilities and ease of use.
Benefits to use the semiconductor parameter analyzer
The semiconductor parameter analyzer provides better performance, usability and efficiency for your characterization tasks. The parameter analyzer integrates multiple measurement resources in a box, and it enables IV and CV measurement easily without gathering and integrating multiple instruments such as power supply, voltage meter, current meter, LCR meter, switching matrix, etc. The key measurement component of the parameter analyzer is a Source/Measure Unit (SMU). The SMU is a measurement module that combines the capabilities of a voltage/current source and a voltage/current meter into a single module. Because the source and measurement circuitry is closely integrated, you can achieve far better accuracy and higher resolution with less measurement error than using various independent instruments to make the same measurement.
In addition, the parameter analyzer furnishes the analysis capability, and you can check and analyze the measurement result quickly and interactively on the screen without an external PC. The versatility of the semiconductor parameter analyzer can be used for various measurement situations from exploratory analysis to automated testing.
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| Quickly get IV characteristics | Simplified SMU circuit diagram |
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