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The Keithley 2520 Pulsed Laser Diode Test System is an integrated, synchronized system for testing laser diodes early in the manufacturing process, when proper temperature control cannot be easily achieved. The Keithley 2520 provides all sourcing and measurement capabilities needed for pulsed and continuous LIV (light-currentvoltage) testing of laser diodes in one compact, half-rack instrument. The tight synchronization of source and measure capabilities ensures high measurement accuracy, even when testing with pulse widths as short as 500ns.
There are three channels of source and measurement circuitry in the Keithley 2520. All three channels are controlled by a single digital signal processor (DSP), which ensures tight synchronization of the sourcing and measuring functions. The laser diode drive channel provides a current source coupled with voltage measurement capability. Each of the two photodetector channels supplies an adjustable voltage bias and voltage compliance, in addition to current measurement capability. These three channels provide all the source and measure capabilities needed for full LIV characterization of laser diodes prior to integration into temperature controlled modules. By eliminating the need for GPIB commands to perform test sweeps with multiple separate instruments, the Keithley 2520’s integrated sourcing and measurement allows a significant improvement in throughput.
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